In this study, an acceleration life test was conducted to evaluate the reliability of major electronic equipment to meet the operational environment and operational concepts of the Middle East with the goal of improving the reliability of electronic equipment to be installed in an export-type K2 tank. The results of the acceleration life test were used to identify potential failure risk factors in the electronic equipment design stage, and to predict whether the target life with a cumulative failure probability of 5% for 10 years could be met. In this study, the target life was determined by allocating the design mean time between failure (MTBF) and K-LOG MTBF the same weight of 50% each, and the acceleration life test method for temperature/humidity stress was designed and the acceleration life test was conducted. In addition, the calculation formula for the acceleration life test time under acceleration life test conditions was verified using MINITAB Software. Under the acceleration life test conditions, the test was completed without failure until the acceleration life test time, and it was found that the target life with a cumulative failure rate of 5% for 10 years was met. In the future, the acceleration life test will be conducted until an actual failure occurs, and life data for the test object and the cause of the failure will be supplemented.